碳材料由于其結構多樣性，導致其性能多樣化，因而應用領域廣闊，碳材料研究已受到全球材料科學界、物理學界、化學界的廣泛關注。本書系統介紹了碳材料表征技術及應用。包括X射線粉末衍射、小角X射線散射、透射電鏡、掃描電子顯微鏡、圖像分析、拉曼光譜、X射線光電子能譜、磁電阻、電化學性能、氣體吸附/解吸等溫線、熱分析、表面官能團滴定測定、程序升溫脫附技術。本書讀者對象為材料領域的科技人員、研究生和高校教師。本書以英文著述，并與Elsevier出版集團合作，已在海外出版。
Michio Inagaki教授，日本北海道大學榮休教授。擔任過日本碳素學會主席，JSPS117委員會主席，Carbon雜志副主編。獲得過美國和中國碳素學會、日本陶瓷學會學術貢獻獎。出版8本書，發表700多篇學術論文。Feiyu Kang（康飛宇），教授，清華大學深圳研究生院院長。現任SCI刊物《Carbon》顧問編委，SCI刊物《新型炭材料》副主編，層間化合物系列國際會議（ISIC）國際顧問委員會委員。曾獲國家發明獎等多項獎勵。出版中英文專著5部，在國內外發表論文200多篇。
List of Contributors.................................................................................
Preface ...............................................................................................
Acknowledgments ................................................................................
CHAPTER 1 Introduction............................................................ 1
Michio Inagaki, Feiyu Kang
1.1 Carbon Materials............................................................... 1
1.2 Characterization of Carbon Materials.................................... 3
1.3 Structure of the Present Book.............................................. 5
References.............................................................................. 6
CHAPTER 2 X-ray Powder Diffraction ......................................... 7
Norio Iwashita
2.1 Introduction...................................................................... 7
2.2 X-ray Diffraction Pattern of Carbon Materials........................ 8
2.3 Parameters Determined by X-ray Diffraction.........................10
2.4 Instrumentation ................................................................11
2.5 Specifications for Measurement ..........................................14
2.5.1 Preparation of Sample for X-ray Measurements............ 14
2.5.2 Measurement and Intensity Correction of Diffraction
Profiles.................................................................. 14
2.5.3 Correction of Diffraction Angle With Internal
Standard ................................................................ 16
2.5.4 Determination of Full Width at Half Maximum
Intensity ................................................................ 17
2.5.5 Accuracy of the Values Determined............................ 18
2.6 Degree of Graphitization ...................................................18
2.7 Key Issues for Measurement...............................................21
2.7.1 Diffraction Pattern................................................... 21
2.7.2 Use of Internal Standard........................................... 21
2.7.3 Use of Thin Sample Holder....................................... 22
2.7.4 Indexing the Diffraction Line .................................... 23
2.7.5 Separation into Component Profiles............................ 23
2.8 Concluding Remarks.........................................................24
References.............................................................................24
新書資訊